Bilateral Microscope Position Displacement Measurement System 'TM-200'
A system capable of supporting FA automation! Both sides can be equipped with AF, allowing for highly reproducible measurements.
The "TM-200" is a dual-sided microscope displacement measurement system equipped with AF functionality, capable of automatically measuring positional deviations on both sides with high precision. It has been miniaturized and enhanced for high accuracy, allowing measurement of positional deviations on both sides within ±1μm. An IR camera can also be mounted on the bottom, enabling measurement of internal positional deviations. Please use it for applications such as simultaneous observation and video recording of the front and back of electronic paper, electrophoresis, particles, and fluids. 【Features】 - Equipped with AF functionality for high-precision automatic measurement of positional deviations on both sides - Miniaturized and enhanced for high accuracy, capable of measuring positional deviations on both sides within ±0.5μm - Compatible with FA automation - Both sides can be equipped with AF, allowing for highly reproducible measurements - An IR camera can also be mounted on the bottom, enabling measurement of internal positional deviations *For more details, please refer to the PDF document or feel free to contact us.
- Company：フローベル
- Price：Other
